Evaluation of a new secondary ion optics for the secondary ion microscope.
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of the Spectroscopical Society of Japan
سال: 1986
ISSN: 1884-6785,0038-7002
DOI: 10.5111/bunkou.35.485